Offer
Roltec has a well-equipped laboratory and an experimental production line for the production of photovoltaic cells using thin-film technology. Using these resources and thanks to our highly qualified staff of specialists and scientists, we carry out tasks commissioned for external entities.
As part of commissioned tasks, we commercially perform:
LABORATORY WORK
Application of thin layers by thermal evaporation
Device: Moorfield MiniLabLT60A
Application of thin layers by magnetron sputtering
Device: Moorfield MiniLabLT80A
Application of thin layers using chemical baths
Device: Depending on your requirements
Transmission and reflection measurement in the range of 380–1100nm (optical spectroscopy)
Device: Filmetrics F10-RT
Spectroscopic measurements in the integrating sphere
Device: Rera QE 5000
Quantum efficiency measurements of solar cells
Device: Rera QE 5000
Measurements of the elemental composition of substances using plasma spectroscopy
Device: Spectruma GD-OES
Surface morphology measurements (roughness, topography, step height)
Device: Filmetrics Profilm3D
Measurements of electrical parameters of high-resistance materials (conductivity, square resistance)
Device: Mitsubishi MCP-HT 450
Measurements of the efficiency of photovoltaic cells in STC (AM1.5G spectrum, class A+AA simulator)
Device: Enlitech SS-X160R
Microscopic observations - electron microscope, composition analysis using an EDS detector
Device: ThermoFischer InspectF
Measurements of current-voltage characteristics of semiconductor devices (diodes, cells, transistors, etc.)
Device: Keithely 2600 series
Surface condition analysis (activation energy)
Device: Kruss mobile surface analyzer
XRF measurements in the range of 0–50keV
Device: Spectro XEPOS III
Numerical analysis of the results of optical measurements (calculation of dielectric functions), electrical, morphology, etc.
Roltec's own software
Microscopic observations - electron microscope, SE or BSE mode (magnification, depending on the material, up to 100,000x)
Device: ThermoFischer InspectF
Microscopic observations — optical microscope (up to 1500x, observations in light and dark field)
Device: Zeiss Axiolab 5
Computer modeling of semiconductor devices, processes and efficiency of solar cells
Roltec's own software
SERVICES ON PILOT PHOTOVOLTAIC LINE DEVICES
Laser structuring of thin layers using 532nm or 1064nm waves. Accuracy xy<30um
Device: MASTER1 GSGP 532 picosecond laser
Glass lamination with EVA foil (up to 12 mm thick sheet, maximum laminate thickness 50 mm)
Device: Fangding Mekanika
Measurements of the efficiency of PV modules in the range of 0–150V, 0–2A, under STC conditions
Device: Hoenle SOL 2000 RF2 EPS
Measurements of the efficiency of PV modules (any range allowed by standards), under STC conditions
Device: Metrel 3108 Eurotest PV
Basic glass processing (max. format 120x60cm): cutting, blunting edges, drilling 5mm holes
Device: Szkło-tech WD-1 drill
Control and measurement tests of photovoltaic installations
Device: Metrel 3108 Eurotest PV
We invite you to cooperate!
Details of orders, including costs, are discussed during individual conversations with the client. Laboratory contact: tel. 65 537 39 99 or biuro@roltec.pl
